Description: Former rental book. Not the prettiest book but still very usable. May have highlighting, cover wear, creasing, staining, mild water wrinkling, etc. Ships quickly! Your satisfaction is my highest priority!
Price: 8.72 USD
Location: Alpharetta, Georgia
End Time: 2024-09-23T20:07:13.000Z
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Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
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Number of Pages: Xix, 689 Pages
Publication Name: Scanning Electron Microscopy and X-Ray Microanalysis
Language: English
Publisher: Springer
Publication Year: 2003
Subject: Materials Science / General, Life Sciences / Biophysics, Electron Microscopes & Microscopy, Microscopes & Microscopy
Features: Revised
Type: Textbook
Item Weight: 72.2 Oz
Author: Eric Lifshin, Joseph Goldstein, David C. Joy, Patrick Echlin, Charles E. Lyman
Subject Area: Non-Classifiable, Technology & Engineering, Science
Item Length: 10 in
Item Width: 7 in
Format: Hardcover
