Description: JEOL JWS 7555 is a scanning electron microscope (SEM) that utilizes an advanced electron optical equipment, providing a high level of image performance. It is suitable for a wide range of applications, including thin film synthesis, nanomaterials, and biological sample observation. JWS 7555 features a large chamber, variable pressure operation, digital tilt control, and loadlock technology, making it suitable for demanding applications. The microscope includes a field emission gun (FEG) that offers a long lifetime and variable beam spot size. This allows for high-quality imaging to be obtained at high magnification and low working distances. The electron optics and FEG are fitted in the bottom section of the column, offering enhanced stability and reduced vibration. It also allows the chamber to be mounted closer to the sample, reducing the occurrence of electron scattering.
Price: 55000 USD
Location: Hayward, California
End Time: 2024-10-26T18:47:55.000Z
Shipping Cost: N/A USD
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Item Specifics
All returns accepted: ReturnsNotAccepted
Brand: JEOL
MPN: JWS-7555
