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JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX

Description: Jeol JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX USED, UNABLE TO TEST, AVAILABLE FOR INSPECTION. INCLUDES: NORAN SYSTEMS EDX MODEL 700P128425 SEIKO SEKI TURBO PUMP, MANUALS, ALL CABLES FOB OUR DOCK IN TEMPLE, TEXAS 76504, WE PREFER THAT BUYER ARRANGE FOR SHIPPING CURRENTLY SKIDDED, CRATING IS EXTRA LOGAN TECHNOLOGIES, LP 2547602424

Price: 11600 USD

Location: Temple, Texas

End Time: 2024-02-09T16:47:25.000Z

Shipping Cost: N/A USD

Product Images

JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX

Item Specifics

All returns accepted: ReturnsNotAccepted

Brand: Jeol

Jeol 7505 SEM: Jeol Scanning Electron Microscope

NORAN SYSTEMS: JEOL SEM

Microscope Type: SEM

Model: 7505 WAFER INSPECTION SYSTEMS

UPC: Does not apply

MPN: JWS-7505

Country/Region of Manufacture: Japan

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