Description: Good+; Hardcover; Withdrawn library copy with the standard library markings; Light wear to the covers; Library stamps to the endpapers; Text pages are clean & unmarked; Good binding; This book will be stored and delivered in a sturdy cardboard box with foam padding; Medium-Large Format (Quatro, 9.75" – 10.75" tall); Orange cloth covers with title in black lettering; 1986, Springer-Verlag Publishing; 349 pages; "Exafs: Basic Principles and Data Analysis (Inorganic Chemistry Concepts)," by Boon K. Teo. Seller Background: We are a small, online bookseller based out of Bellingham, WA specializing in modern rare and out-of-print titles. We have been active in the book trade for over ten years and have been an active Ebay member since 2002. All of our books are carefully cleaned and restored to the best possible condition prior to being offered for sale. Our books are graded conservatively with ex-library books never graded above "Good" and used books very rarely graded above "Very Good". Domestic Shipping Notes: We use a fulfillment company (Amazon Fulfillment) to package and ship all orders shipping to a location within the USA. Orders placed with "Standard Shipping" ship by USPS Media Mail. Orders placed with "Expedited Shipping" ship by either Fed-Ex or UPS 2-day delivery. A street address is required for the Expedited Shipping service (FedEx/UPS cannot delivery to PO Boxes). Our fulfillment company also offers a 1-day/overnight shipping option which is available upon special request. Return Policy: We accept returns for any reason as long as we are notified of your intent to return within two weeks of the date of receipt. The buyer is responsible for return shipping on all discretionary returns. If the return is due to an error in our description or from damage caused by the shipping carrier we will reimburse all shipping costs paid by the buyer. Book Info: The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970s, have led to the recognition of the structural content of this technique. At the same time, the availability of synchrotron radiation has greatly improved both the acquisition and the quality of the EXAFS data over those obtainable from conventional X-ray sources. Such developments have established EXAFS as a powerful tool for structure studies. EXAFS has been successfully applied to a wide range of significant scientific and technological systems in many diverse fields such as inorganic chemistry, biochemistry, catalysis, material sciences, etc. It is extremely useful for systems where single-crystal diffraction techniques are not readily applicable (e.g., gas, liquid, solution, amorphous and polycrystalline solids, surfaces, polymer, etc.). Despite the fact that the EXAFS technique and applications have matured tremendously over the past decade or so, no introductory textbook exists. EXAFS: Basic Principles and Data Analysis represents my modest attempt to fill such a gap. In this book, I aim to introduce the subject matter to the novice and to help alleviate the confusion in EXAFS data analysis, which, although becoming more and more routine, is still a rather tricky endeavor and may, at times, discourage the beginners. Inventory #: SKU-U07CF09901086
Price: 124.95 USD
Location: Bellingham, Washington
End Time: 2025-01-06T04:08:42.000Z
Shipping Cost: 0 USD
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